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There are no easy methods for companies to compare their manufacturing yields with other similar businesses. A common question asked by many company managers is “How does my process compare with other companies in terms of yield”? The information does not exist or is not easily available to small and medium volume companies

The most commonly used method of illustrating yield is Part Per Million (PPM) Defective. This provides a measure of the defect level against a process stage or a specific product compared against a known number of opportunities for defects to occur. There are IPC and IEC documents and procedures which do exist to monitor a process. This webinar will show how to implement a defect monitoring project in your company and the yield data produced. Bob Willis ran the SMART Group PPM Monitoring project supported by DTI and helped implement the LEADOUT project. these were the first project or their type in the world

The webinar will run for between 60-90 min with question and answer session. The webinars are limited to 100 delegates/companies. A copy of each of the slides presented will be provided after the webinar

Presented by Bob Willis

Topics covered:

Why monitor your process for yield?
PPM, DPM or DPU
Collecting Inspection Data
Screen Printing
Inspection Criteria
Common Defects
Component Placement
IPC Inspection Criteria
Reflow Soldering
IPC Inspection Criteria
Wave Soldering
Collaborative Data

After the webinar there is a Q&A session which provides ample time for all delegate questions to be answered. However, if a delegate has a process example they would like cover in the webinar it will need to be provided in advance of the session

Each webinar last approximately 60-90mins with the opportunity for questions